The DFT team is dedicated to achieving testability to detect manufacturing defects in the designs. As DFT is a vital and often challenging step, our team simplifies and optimizes it, ultimately reducing costs and accelerating time-to-market.
With expertise in scan insertion, Automatic Test Pattern Generation (ATPG), Boundary Scan/JTAG, and coverage analysis, we provide comprehensive DFT solutions at both the IP and SoC levels. Our team focuses on maximizing test coverage, reducing test time, and improving yield, ensuring that your final product meets the highest quality standards.
By adopting advanced DFT methodologies and the latest industry tools, Ulkasemi’s team integrates efficient and effective test strategies throughout the design flow. Our goal is to deliver reliable, cost-effective test solutions that enhance the overall success and reliability of your SoC design.